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Instrumentation and Capabilities


Transmission Electron Microscope (TEM) 
Model: JEOL JEM-2100
Specs: 200 kV; LaB6 source; 1.4 Å resolution                                                                                                   
Capabilities: Tomography; montage; single particle reconstruction; multi-specimen holder; dual-axis tomography specimen holder; motorized x-y tilt specimen holder.


Scanning Electron Microscope (SEM)
Model: FEI Quanta 200 3D
Specs: 30 kV; Tungsten source; 3.5 nm resolution
Capabilities: ETD; SSBED; LFD; GSED; variable pressure imaging; peltier cooling stage; energy dispersive X-ray spectroscopy (EDS); focused ion beam (FIB); auto slice and view; gas injector system (GIS) for platinum deposition; nanometer pattern generation system (NPGS) for electron and ion beam lithography.


Laser Scanning Confocal Microscope (LSCM)
Model: Leica TCS SP5
Specs: 200 nm resolution; Laser sources: Blue multi-line Argon (Ar) 100 mW; Green Helium/Neon (He/Ne) 1 mW; Red Helium/Neon (He/Ne) 10 mW
Capabilities: Transmitted Light modes: BF, DIC, POL; Fluorescence imaging of up to 3 fluorochromes and 1 BF channel simultaneously; excitation and emission wavelengths across entire visible spectrum; confocal resonance scanning head for high quality video frame rate imaging; tempurature, humidity and atmosphere controlled enclosure for live cell imaging; analysis and imaging in X, Y, Z, T, and Λ axes; 3D projections and animations.


EM Sample Preparation Equipment:

Leica EM CPC Plunge Freezer
Denton Vacuum 502B Carbon Evaporator 
Baltec CPD-030 Critical Point Dryer
Leica UC6 Ultramicrotome
Leica EM KMR2 Glass Knife Maker
Denton Vacuum Desk IV Sputter Coater
Thermo Scientific Cytospin 4
SPEX SamplePrep 6770 Freezer/Mill 
Pelco easiGlow Glow Discharge Unit
Taylor-Wharton Cryogenic Freezers (35 L)
60°C Drying Ovens                                                                                                 
Dissecting Microscopes